Hardcover; symposium held April 15-18, 1985, in San Francisco; fading and shelf wear to exterior; binding slightly cocked; scrape to side edge of front cover; note written on table of contents page, otherwise text is clean; former owner's stamping inside rear board; contents in good condition.

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Bibliographic Details

Title: Microscopic Identification of Electronic Defects in Semiconductors (Materials Research Society Symposia Proceedings, Volume 46)
Publisher: Materials Research Society
Publication Date: 1985
Language: English
ISBN 10: 0931837111
ISBN 13: 9780931837111
Binding: Hardcover
Condition: UsedGood

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