Microwave Electronics: Measurement and Materials Characterization
Language: English
Published by Wiley, 2004
- Hardcover
- Used
Condition: Used - Fine
Current price: US$ 133.59
Quantity: 1 available
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- Title
- Microwave Electronics: Measurement and Materials Characterization
- Author
- L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan et Vijay K. Varadan
- Publisher
- Wiley
- Publication year
- 2004
- Condition
- Très bon
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 0470844922
- ISBN 13
- 9780470844922
- Provides a comprehensive introduction to microwave theory and microwave measurement techniques.
- Examines every aspect of microwave material properties, circuit design and applications.
- Presents materials property characterisation methods along with a discussion of the underlying theory.
- Outlines the importance of microwave absorbers in the reduction in noise levels in microwave circuits and their importance within defence industry applications.
- Relates each measurement technique to its application across the fields of microwave engineering, high-speed electronics, remote sensing and the physical sciences.
This book will appeal to practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. Senior students, researchers in microwave engineering and microelectronics and material scientists will also find this book a very useful reference.
"Synopsis" may belong to another edition of this title.
About the Author
L. F. Chen is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.
C. K. Ong is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.
C. P. Neo is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.
V. V. Varadan is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.
Vijay K. Varadan is the author of Microwave Electronics: Measurement and Materials Characterization, published by Wiley.
"About the title" may belong to another edition of this title.
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