RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors

Language: English

Published by SciTech Publishing Inc, US, 2010

1891121898 / 9781891121890

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This book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success. The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such as: small signal, large signal, noise, and the artificial neural network based.

Seller Inventory # LU-9781891121890

Title
RF and Microwave Modeling and Measurement Techniques for Field Effect Transistors
Author
Jianjun Gao
Publisher
SciTech Publishing Inc, US
Publication year
2010
Condition
New
Binding
Hardback
Language
English
ISBN 10
1891121898
ISBN 13
9781891121890

Rarewaves USA United

HEBRON, KY, U.S.A.

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AbeBooks seller since June 20, 2025

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