Minimum Error Entropy Classification

Joaquim P. Marques de Sá

ISBN 10: 3642437427 / ISBN 13: 9783642437427

Published by Springer Berlin Heidelberg, 2014

About this Item

Druck auf Anfrage Neuware - Printed after ordering - This book explains the minimum error entropy (MEE) concept applied to data classification machines. Theoretical results on the inner workings of the MEE concept, in its application to solving a variety of classification problems, are presented in the wider realm of risk functionals.Researchers and practitioners also find in the book a detailed presentation of practical data classifiers using MEE. These include multi-layer perceptrons, recurrent neural networks, complexvalued neural networks, modular neural networks, and decision trees. A clustering algorithm using a MEE-like concept is also presented. Examples, tests, evaluation experiments and comparison with similar machines using classic approaches, complement the descriptions.

Seller Inventory # 9783642437427

Bibliographic Details

• Title: Minimum Error Entropy Classification
• Publisher: Springer Berlin Heidelberg
• Publication Date: 2014
• Language: English
• ISBN 10: 3642437427
• ISBN 13: 9783642437427
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 16D millimeters 235 millimeters width by 155 millimeters height by 16 millimeters depth
• Weight: 429 grams

About this title

Synopsis

This book explains the minimum error entropy (MEE) concept applied to data classification machines. Theoretical results on the inner workings of the MEE concept, in its application to solving a variety of classification problems, are presented in the wider realm of risk functionals.

Researchers and practitioners also find in the book a detailed presentation of practical data classifiers using MEE. These include multi‐layer perceptrons, recurrent neural networks, complexvalued neural networks, modular neural networks, and decision trees. A clustering algorithm using a MEE‐like concept is also presented. Examples, tests, evaluation experiments and comparison with similar machines using classic approaches, complement the descriptions.