Modeling and Analysis of Stochastic Systems (Chapman & Hall/CRC Texts in Statistical Science)

Kulkarni, Vidyadhar G.,Kulkarni, Vidyadhar G.

ISBN 10: 0412049910 / ISBN 13: 9780412049910

Published by Chapman and Hall/CRC, 1996

About this Item

Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!

Seller Inventory # S_475942610

Bibliographic Details

• Title: Modeling and Analysis of Stochastic Systems (Chapman & Hall/CRC Texts in Statistical Science)
• Publisher: Chapman and Hall/CRC
• Publication Date: 1996
• Language: English
• ISBN 10: 0412049910
• ISBN 13: 9780412049910
• Binding: Hardcover
• Condition: Good

About this title

Synopsis

This practical and accessible text enables readers from engineering, business, operations research, public policy and computer science to analyze stochastic systems. Emphasizing the modeling of real-life situations with stochastic elements and analyzing the resulting stochastic model, it presents the major cases of useful stochastic processes-discrete and continuous time Markov chains, renewal processes, regenerative processes, and Markov regenerative processes.The author provides reader-friendly yet rigorous coverage. He follows a set pattern of development for each class of stochastic processes and introduces Markov chains before renewal processes, so that readers can begin modeling systems early. He demonstrates both numerical and analytical solution methods in detail and dedicates a separate chapter to queueing applications.Modeling and Analysis of Stochastic Systems includes numerous worked examples and exercises, conveniently categorized as modeling, computational, or conceptual and making difficult concepts easy to grasp. Taking a practical approach to working with stochastic models, this book helps readers to model and analyze the increasingly complex and interdependent systems made possible by recent advances.

About the Author

University of North Carolina, Chapel Hill, USA