Modeling and Characterization of RF and Microwave Power Fets

Aaen Peter Pl Jaime A. Wood John

ISBN 10: 0521336171 / ISBN 13: 9780521336178

Published by Cambridge University Press, 2011

About this Item

Print on Demand pp. 380 67:B&W 6.69 x 9.61 in or 244 x 170 mm (Pinched Crown) Perfect Bound on White w/Gloss Lam.

Seller Inventory # 5870622

Bibliographic Details

• Title: Modeling and Characterization of RF and Microwave Power Fets
• Publisher: Cambridge University Press
• Publication Date: 2011
• Language: English
• ISBN 10: 0521336171
• ISBN 13: 9780521336178
• Binding: Soft cover
• Condition: New

About this title

Synopsis

This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.

Book Description

This book was the first to be devoted to the compact modeling of RF power FETs. In it, you will find the techniques, verification and validation procedures required to produce a transistor model. The text also contains real-world examples.