Modeling and Simulation of System In Package | Electro-Thermal Modeling

Alexey V. Petrushin

ISBN 10: 3639259475 / ISBN 13: 9783639259476

Published by VDM Verlag Dr. Müller, 2010

About this Item

Modeling and Simulation of System In Package | Electro-Thermal Modeling | Alexey V. Petrushin | Taschenbuch | Englisch | VDM Verlag Dr. Müller | EAN 9783639259476 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu.

Seller Inventory # 107489324

Bibliographic Details

• Title: Modeling and Simulation of System In Package | Electro-Thermal Modeling
• Publisher: VDM Verlag Dr. Müller
• Publication Date: 2010
• Language: English
• ISBN 10: 3639259475
• ISBN 13: 9783639259476
• Binding: Taschenbuch
• Condition: Neu
• Seller catalogs:
  • Bücher

About this title

Synopsis

For the robust development of System in Package, increasing of the engineering efficiency and reducing costs, a careful electrical and thermo- mechanical design is found to be vital. The focus of this book is on how to create and simulate effective electrical and thermal models of SiP. The first part is devoted to a new method for I/O buffer simulation, designed on the basis of IBIS methodology and by using VHDL-AMS language. The discussed VHDL-AMS model demonstrates a good performance when compared to the transistor level model. With respect to the IBIS model, an improvement in simulation accuracy of at least 38% is observed. The second part is a presentation of an accurate and efficient thermal model of BGA multi-chip package. This model is sufficiently simple and precise to permit evaluation of the package characteristics in the early phase of design for an optimal SiP design from the thermal point of view. The model was validated by performing simulations with multi-heat sources under various boundary conditions. It was observed that the presented model can predict the junction temperature with an error below 10%, with respect to 3D numerical simulations.

About the Author

received the Engineer degree from MSTU named after N.E.Bauman, Russia and the Ph.D degree from the Politecnico di Milano, Italy. Research interests: signal integrity issues in high speed circuit design, I/O buffer behavioral modeling and simulation, thermal analysis of electronic devices, process measurement instruments for oil&gas industry.