Models for Uncertainty in Educational Testing

Nicholas T. Longford

ISBN 10: 1461384656 / ISBN 13: 9781461384656

Published by Springer New York, Springer New York, 2011

About this Item

Druck auf Anfrage Neuware - Printed after ordering - A theme running through this book is that of making inference about sources of variation or uncertainty, and the author shows how information about these sources can be used for improved estimation of certain elementary quantities. Amongst the topics covered are: essay rating, summarizing item-level properties, equating of tests, small-area estimation, and incomplete longitudinal studies. Throughout, examples are given using real data sets which exemplify these applications.

Seller Inventory # 9781461384656

Bibliographic Details

• Title: Models for Uncertainty in Educational Testing
• Publisher: Springer New York, Springer New York
• Publication Date: 2011
• Language: English
• ISBN 10: 1461384656
• ISBN 13: 9781461384656
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 17D millimeters 235 millimeters width by 155 millimeters height by 17 millimeters depth
• Weight: 464 grams

About this title

Synopsis

A theme running through this book is that of making inference about sources of variation or uncertainty, and the author shows how information about these sources can be used for improved estimation of certain elementary quantities. Amongst the topics covered are: essay rating, summarizing item-level properties, equating of tests, small-area estimation, and incomplete longitudinal studies. Throughout, examples are given using real data sets which exemplify these applications.

From the Back Cover

The aim of this monograph is to present a survey of modern statistical techniques applied to educational and psychological testing. A theme that runs through this book is that of making inferences about sources of variation or uncertainty. The author shows how information about these sources can be used for improved (shrinkage) estimation of certain elementary quantities. Among the topics covered are essay rating, summarizing item-level properties, test equating, small-area estimation, and longitudinal analysis with missing data. Throughout, examples are given using real data sets that exemplify these applications.