Modern Characterization of Electromagnetic Systems and its Associated Metrology

Language: English

Published by John Wiley and Sons Inc, US, 2021

1119076463 / 9781119076469

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New method for the characterization of electromagnetic wave dynamics Modern Characterization of Electromagnetic Systems introduces a new method of characterizing electromagnetic wave dynamics and measurements based on modern computational and digital signal processing techniques. ?The techniques are described in terms of both principle and practice, so readers understand what they can achieve by utilizing them. Additionally, modern signal processing algorithms are introduced in order to enhance the resolution and extract information from electromagnetic systems, including where it is not currently possible. For example, the author addresses the generation of non-minimum phase or transient response when given amplitude-only data. Presents modern computational concepts in electromagnetic system characterizationDescribes a solution to the generation of non-minimum phase from amplitude-only dataCovers model-based parameter estimation and planar near-field to far-field transformation as well as spherical near-field to far-field transformation Modern Characterization of Electromagnetic Systems is ideal for graduate students, researchers, and professionals working in the area of antenna measurement and design. It introduces and explains a new process related to their work efforts and studies.…

Seller Inventory # LU-9781119076469

Title
Modern Characterization of Electromagnetic Systems and its Associated Metrology
Author
Magdalena Salazar-Palma, Ming Da Zhu, Tapan K. Sarkar, Heng Chen
Publisher
John Wiley and Sons Inc, US
Publication year
2021
Condition
New
Binding
Hardback
Language
English
ISBN 10
1119076463
ISBN 13
9781119076469
Item weight
1,260 grams

Rarewaves.com USA

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