Multi-Chip Module Test Strategies (Frontiers in Electronic Testing)

Zorian, Yervant (Editor)

ISBN 10: 1461377986 / ISBN 13: 9781461377986

Published by Springerverlag Us, 2012

About this Item

reprint edition. 167 pages. 10.24x7.68x0.38 inches. In Stock.

Seller Inventory # zk1461377986

Bibliographic Details

• Title: Multi-Chip Module Test Strategies (Frontiers in Electronic Testing)
• Publisher: Springerverlag Us
• Publication Date: 2012
• Language: English
• ISBN 10: 1461377986
• ISBN 13: 9781461377986
• Binding: Paperback
• Condition: Brand New
• Weight: 0.37 kilograms

About this title

Synopsis

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs.
Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain.
Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).