Multi-Chip Module Test Strategies (Frontiers in Electronic Testing)

Yervant Zorian

ISBN 10: 079239920X / ISBN 13: 9780792399209

Published by Kluwer Academic Pub, 1997

About this Item

166 pages. 10.75x8.25x0.75 inches. In Stock.

Seller Inventory # x-079239920X

Bibliographic Details

• Title: Multi-Chip Module Test Strategies (Frontiers in Electronic Testing)
• Publisher: Kluwer Academic Pub
• Publication Date: 1997
• Language: English
• ISBN 10: 079239920X
• ISBN 13: 9780792399209
• Binding: Paperback
• Condition: Brand New
• Weight: 0.57 kilograms

About this title

Synopsis

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs.
Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain.
Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).