Multi-run Memory Tests for Pattern Sensitive Faults

Language: English

Published by Springer, Springer Jul 2018, 2018

3319912038 / 9783319912035

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This item is printed on demand - Print on Demand Titel. Neuware -This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process;Presents practical algorithms for design and implementation of efficient multi-run tests;Demonstrates methods verified by analytical and experimental investigations.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 148 pp. Englisch.

Seller Inventory # 9783319912035

Title
Multi-run Memory Tests for Pattern Sensitive Faults
Author
Ireneusz Mrozek
Publisher
Springer, Springer Jul 2018
Publication year
2018
Condition
Neu
Binding
Buch
Language
English
ISBN 10
3319912038
ISBN 13
9783319912035
Item weight
395 grams
Dimensions
241x160x14 mm

buchversandmimpf2000

Emtmannsberg, BAYE, Germany

5-star seller

AbeBooks seller since January 23, 2017

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Impressum Thorsten Retsch Buchversand Mimpf2000 Oberölschnitz 16 95517 Emtmannsberg Deutschland Telefon: 09209-2023188 Email: mimpf2000@online.de USt-ID-Nr.: DE 235096871 Wir führen gebrauchte Bücher aus allen Sparten der Literatur

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