Multi-scale modeling and trans-level damage simulation method | 2nd Edition

Bin Sun

ISBN 10: 6208496195 / ISBN 13: 9786208496197

Published by LAP LAMBERT Academic Publishing, 2025

About this Item

Multi-scale modeling and trans-level damage simulation method | 2nd Edition | Bin Sun | Taschenbuch | Englisch | 2025 | LAP LAMBERT Academic Publishing | EAN 9786208496197 | Verantwortliche Person für die EU: SIA OmniScriptum Publishing, Brivibas Gatve 197, 1039 RIGA, LETTLAND, customerservice[at]vdm-vsg[dot]de | Anbieter: preigu.

Seller Inventory # 133937044

Bibliographic Details

• Title: Multi-scale modeling and trans-level damage simulation method | 2nd Edition
• Publisher: LAP LAMBERT Academic Publishing
• Publication Date: 2025
• Language: English
• ISBN 10: 6208496195
• ISBN 13: 9786208496197
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 220W x 150H x 8D millimeters 220 millimeters width by 150 millimeters height by 8 millimeters depth
• Weight: 197 grams
• Seller catalogs:
  • Bücher

About this title

Synopsis

A new adaptive multi-scale method is developed to simulate the trans-level failure process of concrete-based structures from evolving random damage in meso-scale to structural failure with three-hierarchy model which respectively describe non-key, key and damaged regions with different sizes of elements. Automated optimization design system coupled in the method ensures adaptive hierarchy change due to evolving damage without user intervention in the computation. The adaptive modeling strategy and theory of the method have been discussed by considering the multi-scale and cross-level damage evolution from meso-scale to macro-scale and across the material, component and structural level with lower cost and sufficient precision. As a case study of the method, the process of evolving meso-damage to structural failure of one concrete structure is simulated, which shows that the developed method can be used to reveal the failure mechanisms of concrete structures from the view of meso-scale as well as better computational efficiency.