An NMOS test chip for a course in semiconductor parameter measurements Volume NIR 84-2822 [LeatherBound]

Roenker, K. P.,Linholm, L. W.

Publication Date: 2025

About this Item

BOOKS ARE EXEMPT FROM IMPORT DUTIES AND TARIFFS; NO EXTRA CHARGES APPLY. LeatherBound edition. Condition: New. Reprinted from edition. Leather Binding on Spine and Corners with Golden leaf printing on spine. NO changes have been made to the original text. This is NOT a retyped or an ocr'd reprint. Illustrations, Index, if any, are included in black and white. Each page is checked manually before printing. Pages: 58 As this print on demand book is reprinted from a very old book, there could be some missing or flawed pages, but we always try to make the book as complete as possible. Fold-outs, if any, are not part of the book. If the original book was published in multiple volumes then this reprint is of only one volume, not the whole set. Sewing binding for longer life, where the book block is actually sewn (smythe sewn/section sewn) with thread before binding which results in a more durable type of binding. Pages: 58 Volume NIR 84-2822 Language: English.

Seller Inventory # LB990000051523

Bibliographic Details

• Title: An NMOS test chip for a course in semiconductor parameter measurements Volume NIR 84-2822 [LeatherBound]
• Publication Date: 2025
• Binding: LeatherBound
• Condition: New