Nanometer-scale Defect Detection Using Polarized Light

Dahoo, Pierre Richard; Pougnet, Philippe; El Hami, Abdelkhalak

ISBN 10: 1848219369 ISBN 13: 9781848219366
Published by Wiley-ISTE, 2016
Language: English
Condition: Used - As new Hardcover

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Used - Hardcover

Condition: Used - As new

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