Nanometer-scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems)

Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami

ISBN 10: 1848219369 ISBN 13: 9781848219366
Published by ISTE Ltd. 2016-08-12, 2016
Language: English
Condition: New Hardcover

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New - Hardcover

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