Nanometer-scale Defect Detection Using Polarized Light

Dahoo, Pierre Richard/ Pougnet, Philippe/ El Hami, Abdelkhalak

ISBN 10: 1848219369 ISBN 13: 9781848219366
Published by Iste/Hermes Science Pub, 2016
Language: English
Condition: New Hardcover

Sold by Revaluation Books, Exeter, United Kingdom

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New - Hardcover

Condition: New

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