Nanometrology Using the Transmission Electron Microscope (Iop Concise Physics)
Language: English
Published by Morgan & Claypool, 2015
- Softcover
- New
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- Title
- Nanometrology Using the Transmission Electron Microscope (Iop Concise Physics)
- Author
- Stolojan, Vlad
- Publisher
- Morgan & Claypool
- Publication year
- 2015
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 1681740567
- ISBN 13
- 9781681740560
The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.
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About the Author
University of Surrey, UK
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