Nanoscale Characterisation of Ferroelectric Materials

ISBN 10: 3642058442 / ISBN 13: 9783642058448

Published by Springer, 2010

About this Item

Print on Demand pp. XIV + 282.

Seller Inventory # 5837544

Bibliographic Details

• Title: Nanoscale Characterisation of Ferroelectric Materials
• Publisher: Springer
• Publication Date: 2010
• Language: English
• ISBN 10: 3642058442
• ISBN 13: 9783642058448
• Binding: Soft cover
• Condition: New

About this title

Synopsis

Among the main trends in our daily society is a drive for smaller, faster, cheaper, smarter computers with ever-increasing memories. To sustain this drive the com­ puter industry is turning to nanotechnology as a source of new processes and func­ tional materials, which can be used in high-performance high-density electronic systems. Researchers and engineers have been focusing on ferroelectric materials for a long time due to their unique combination of physical properties. The ability of ferroelectrics to transform electromagnetic, thermal, and mechanical energy into electrical charge has been used in a number of electronic applications, most recently in nonvolatile computer memories. Classical monographs, such as Ferro­ electricity by E. Fatuzzo and W. J. Mertz, served as a comprehensive introduction into the field for several generations of scientists. However, to meet the challenges of the "nano-era", a solid knowledge of the ferroelectric properties at the nano­ scale needs to be acquired. While the science of ferroelectrics from micro-to lar­ ger scale is well established, the science of nanoscale ferroelectrics is still terra in­ cognita. The properties of materials at the nanoscale show strong size dependence, which makes it imperative to perform reliable characterization at this size range. One of the most promising approaches is based on the use of scanning probe microscopy (SPM) which has revolutionized materials research over the last dec­ ade.

From the Back Cover

This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM). It addresses various imaging mechanisms of ferroelectric domains in SPM, quantitative analysis of the piezoresponse signals as well as basic physics of ferroelectrics at the nanoscale level, such as nanoscale switching, scaling effects, and transport behavior. This state-of-the-art review of theory and experiments on nanoscale polarization phenomena will be a useful reference for advanced readers as well for newcomers and graduate students interested in the SPM techniques. The non-specialists will obtain valuable information about different approaches to electrical characterization by SPM, while researchers in the ferroelectric field will be provided with details of SPM-based measurements of ferroelectrics.