Noise Temperature Measurements on Wafer (Classic Reprint)
James Randa
Sold by PBShop.store US, Wood Dale, IL, U.S.A.
AbeBooks Seller since April 7, 2005
New - Hardcover
Condition: New
Ships within U.S.A.
Quantity: 15 available
Add to basketSold by PBShop.store US, Wood Dale, IL, U.S.A.
AbeBooks Seller since April 7, 2005
Condition: New
Quantity: 15 available
Add to basketNew Book. Shipped from UK. Established seller since 2000.
Seller Inventory # LX-9780266842422
Noise temperature measurements on wafer unlocks the practical understanding of how RF devices are tested at the wafer level, showing why measurement accuracy matters for device performance.
This book explains the challenges of on‑wafer noise measurements and how experts establish reliable, traceable results. It connects theory to real‑world testing, drawing on established metrology practices to measure noise temperature and infer noise figure.
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