Novel Voltage Phasor Based Algorithms for Line Outage Identification

Mehebub Alam

ISBN 10: 6206161099 / ISBN 13: 9786206161097

Published by LAP LAMBERT Academic Publishing Mai 2023, 2023

About this Item

This item is printed on demand - it takes 3-4 days longer - Neuware -This book presents the research works related to the development of new algorithms for line outage identification using voltage phasor of PMU. Three new voltage phasor-based algorithms are introduced. The proposed three models are 1) Direct comparison of phasor angle measurement (DCPAM) model 2) Comparison of bus current injection (CBCI) model 3) Comparison of bus power injection mismatch (CBPIM) model. The proposed algorithms also consider the constraints like PMU outage issue and measurement noises which reflect the novelty and reliability of the methodology. The performance of the proposed methodologies are checked on different IEEE test systems in terms of accuracy. 80 pp. Englisch.

Seller Inventory # 9786206161097

Bibliographic Details

• Title: Novel Voltage Phasor Based Algorithms for Line Outage Identification
• Publisher: LAP LAMBERT Academic Publishing Mai 2023
• Publication Date: 2023
• Language: English
• ISBN 10: 6206161099
• ISBN 13: 9786206161097
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 220W x 150H x 5D millimeters 220 millimeters width by 150 millimeters height by 5 millimeters depth
• Weight: 137 grams

About this title

Synopsis

This book presents the research works related to the development of new algorithms for line outage identification using voltage phasor of PMU. Three new voltage phasor-based algorithms are introduced. The proposed three models are 1) Direct comparison of phasor angle measurement (DCPAM) model 2) Comparison of bus current injection (CBCI) model 3) Comparison of bus power injection mismatch (CBPIM) model. The proposed algorithms also consider the constraints like PMU outage issue and measurement noises which reflect the novelty and reliability of the methodology. The performance of the proposed methodologies are checked on different IEEE test systems in terms of accuracy.