On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond (River Publishers Series in Electronic Materials and Devices)
Language: English
Published by River Publishers, 2019
- Hardcover
- New

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- Title
- On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond (River Publishers Series in Electronic Materials and Devices)
- Author
- Rumiantsev, Andrej
- Publisher
- River Publishers
- Publication year
- 2019
- Condition
- New
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 877022112X
- ISBN 13
- 9788770221122
The demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the modern IC design debug.
This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies.
This book presents solutions for accurate mm-wave characterization of advanced semiconductor devices. It guides through the process of development, implementation and verification of the in-situ calibration methods optimized for high-performance silicon technologies.
"Synopsis" may belong to another edition of this title.
About the Author
Andrej Rumiantsev is with MPI Corporation, Taiwan.
"About the title" may belong to another edition of this title.
Biblios
frankfurt am main, hessen, Germany
4-star seller
AbeBooks seller since September 10, 2024
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