Optical Detector Nonlinearity, Simulation (Classic Reprint)

This book is an essential resource for optoelectronic engineers and researchers, seeking a unified mathematical treatment for accurately measuring optical detector nonlinearity. It presents a comprehensive overview of nonlinearity measurement methods, delving into their advantages, disadvantages, and accuracies, enabling the reader to choose the most suitable method for their specific needs. Through computer simulations, the author analyzes key issues, including data uncertainties, error types, and polynomial order, to guide the reader in optimizing measurement system design and data processing for achieving desired accuracy. The book's insights enhance understanding of detector nonlinearity measurement and its impact on optical radiation measurements, providing valuable knowledge for improving the accuracy and reliability of optoelectronic systems.