Optical Measurements, Modeling, and Metrology, Volume 5 : Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics

Tom Proulx

ISBN 10: 1461429056 / ISBN 13: 9781461429050

Published by Springer, Springer, 2013

About this Item

Druck auf Anfrage Neuware - Printed after ordering - Optical Measurements, Modeling, and Metrology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011. The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Mechanics of Biological Systems and Materials, Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials; MEMS and Nanotechnology; Experimental and Applied Mechanics, Thermomechanics and Infra-Red Imaging, and Engineering Applications of Residual Stress.

Seller Inventory # 9781461429050

Bibliographic Details

• Title: Optical Measurements, Modeling, and Metrology, Volume 5 : Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
• Publisher: Springer, Springer
• Publication Date: 2013
• Language: English
• ISBN 10: 1461429056
• ISBN 13: 9781461429050
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 279W x 210H x 24D millimeters 279 millimeters width by 210 millimeters height by 24 millimeters depth
• Weight: 1046 grams

About this title

Synopsis

Optical Measurements, Modeling, and Metrology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011. The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Mechanics of Biological Systems and Materials, Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials; MEMS and Nanotechnology; Experimental and Applied Mechanics, Thermomechanics and Infra-Red Imaging, and Engineering Applications of Residual Stress.

From the Back Cover

Optical Measurements, Modeling and, Metrology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference & Exposition on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011. The full set of proceedings also includes volumes on Dynamic Behavior of Materials, Mechanics of Biological Systems and Materials, Mechanics of Time-Dependent Materials and Processes in Conventional and Multifunctional Materials; MEMS and Nanotechnology; Experimental and Applied Mechanics, Thermomechanics and Infra-Red Imaging, and Engineering Applications of Residual Stress.