Optimal Reliability Design Fundamentals and Applications

Kuo, Way, Prasad, V. Rajendra, Tillman, Frank A., & Hwang, Ching-Lai

ISBN 10: 0521781272 ISBN 13: 9780521781275
Published by Cambridge University Press, New York, NY, 2001
Language: English
Condition: Used Hardcover

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Used - Hardcover

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