Organizational Risk Management: Managing for Uncertainty and Ambiguity (Developments in Managing and Exploiting Risk, 3)

ISBN 10: 3110670194 / ISBN 13: 9783110670196

Published by De Gruyter, 2022

About this Item

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Seller Inventory # ria9783110670196_new

Bibliographic Details

• Title: Organizational Risk Management: Managing for Uncertainty and Ambiguity (Developments in Managing and Exploiting Risk, 3)
• Publisher: De Gruyter
• Publication Date: 2022
• Language: English
• ISBN 10: 3110670194
• ISBN 13: 9783110670196
• Binding: Hardcover
• Condition: New

About this title

Synopsis

Every organization faces difficult decisions when managing risk and the potential consequences of its manifestation. For a more thorough outlook on risk, organizations should also evaluate and engage with its advantages. Organizational Risk Management: Managing for Uncertainty and Ambiguity covers a series of perspectives that represent both causal and interpretative frameworks. These perspectives shed light on how organizational structures and processes adapt amid a complex, dynamic organizational environment in an effort to manage and exploit the accompanying risks of that environment.

This volume will oftentimes challenge the expectation for and utility of clarity in crisis situations, thereby favoring uncertainty and ambiguity as the necessary conditions to exploit organizational risk and explore opportunities that rely on interpretation, learning, and knowledge among individuals.

The ultimate objective of Organizational Risk Management: Managing for Uncertainty and Ambiguity is to promote discussion among practitioners and organizational scholars who venture to understand organizational risk. Setting such a goal is to essentially practice what this volume shall inevitably preach: engage one another in order to proactively monitor and respond to risk. Strengthening ties along the bridge between practice and science will be a welcomed consequence of this volume.

About the Author

Krista N. Engemann, University North Carolina, USA; Kurt J. Engemann, Iona College, USA; Cliff W. Scott, University North Carolina, USA