Particle Characterization in Technology [ 2 volumes ] I. Applications and Microanalysis II. Morphological Analysis. [ Second printing ].

Beddow, John Keith (ed.).

ISBN 10: 0849357845 ISBN 13: 9780849357848
Published by CRC Press, Inc., Boca Raton, Florida, 1985
Language: English
Condition: Used Hardcover

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