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The first edition, published in 1973, has become a classic reference in the field. Now with the second edition, readers will find information on key new topics such as neural networks and statistical pattern recognition, the theory of machine learning, and the theory of invariances. Also included are worked examples, comparisons between different methods, extensive graphics, expanded exercises and computer project topics.
About the Author:
RICHARD O. DUDA, PhD, is Professor in the Electrical Engineering Department at San Jose State University, San Jose, California.
PETER E. HART, PhD, is Chief Executive Officer and President of Ricoh Innovations, Inc. in Menlo Park, California.
DAVID G. STORK, PhD, is Chief Scientist, also at Ricoh Innovations, Inc.
Title: Pattern Classification
Publisher: Wiley-Interscience
Publication Date: 2000
Binding: hardcover
Condition: Good
Edition: 2nd Edition