Pattern Recognition, Machine Intelligence and Biometrics
Sold by Books Puddle, New York, NY, U.S.A.
AbeBooks Seller since November 22, 2018
New - Hardcover
Condition: New
Ships within U.S.A.
Quantity: 4 available
Add to basketSold by Books Puddle, New York, NY, U.S.A.
AbeBooks Seller since November 22, 2018
Condition: New
Quantity: 4 available
Add to basketpp. 800 2011th edition Jointly published with Higher Education Press.
Seller Inventory # 2658570536
"Pattern Recognition, Machine Intelligence and Biometrics" covers the most recent developments in Pattern Recognition and its applications, using artificial intelligence technologies within an increasingly critical field. It covers topics such as: image analysis and fingerprint recognition; facial expressions and emotions; handwriting and signatures; iris recognition; hand-palm gestures; and multimodal based research. The applications span many fields, from engineering, scientific studies and experiments, to biomedical and diagnostic applications, to personal identification and homeland security. In addition, computer modeling and simulations of human behaviors are addressed in this collection of 31 chapters by top-ranked professionals from all over the world in the field of PR/AI/Biometrics.
The book is intended for researchers and graduate students in Computer and Information Science, and in Communication and Control Engineering.
Dr. Patrick S. P. Wang is a Professor Emeritus at the College of Computer and Information Science, Northeastern University, USA, Zijiang Chair of ECNU, Shanghai, and NSC Visiting Chair Professor of NTUST, Taipei.
From the reviews:
“This book is a collection of 31 scientific papers organized in four main sections: ‘Pattern recognition and Machine Intelligence’, ‘Computer Vision and Image Processing’, ‘Face Recognition and Forensics’ and ‘Biometrics Authentication’. These chapters cover a broad domain making the book appealing to a large group of specialists.” (Leon Todoran, IAPR Newsletter, Vol. 34 (4), October, 2012)"About this title" may belong to another edition of this title.
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