Ripley brings together two crucial ideas in pattern recognition: statistical methods and machine learning via neural networks. He brings unifying principles to the fore, and reviews the state of the subject. Ripley also includes many examples to illustrate real problems in pattern recognition and how to overcome them.

About the Author

Brian Ripley is the Professor of Applied Statistics at the University of Oxford and a member of the Department of Statistics as well as a Professorial Fellow of St. Peter's College.

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