Physical and Technical Problems of SOI Structures and Devices

J. -P. Colinge

ISBN 10: 9401040524 / ISBN 13: 9789401040525

Published by Springer Netherlands, Springer Netherlands Okt 2012, 2012

About this Item

This item is printed on demand - Print on Demand Titel. Neuware -In Physical and Technical Problems of SOI Structures and Devices, specialists in silicon-on-insulator technology from both East and West meet for the first time, giving the reader the chance to become acquainted with work from the former Soviet Union, hitherto only available in Russian and barely available to western scientists. Keynote lectures and state-of-the-art presentations give a wide-ranging panorama of the challenges posed by SOI materials and devices, material fabrication techniques, characterisation, device and circuit issues.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 304 pp. Englisch.

Seller Inventory # 9789401040525

Bibliographic Details

• Title: Physical and Technical Problems of SOI Structures and Devices
• Publisher: Springer Netherlands, Springer Netherlands Okt 2012
• Publication Date: 2012
• Language: English
• ISBN 10: 9401040524
• ISBN 13: 9789401040525
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 240W x 160H x 17D millimeters 240 millimeters width by 160 millimeters height by 17 millimeters depth
• Weight: 489 grams

About this title

Synopsis

In Physical and Technical Problems of SOI Structures and Devices, specialists in silicon-on-insulator technology from both East and West meet for the first time, giving the reader the chance to become acquainted with work from the former Soviet Union, hitherto only available in Russian and barely available to western scientists. Keynote lectures and state-of-the-art presentations give a wide-ranging panorama of the challenges posed by SOI materials and devices, material fabrication techniques, characterisation, device and circuit issues.

About the Author

Jean-Pierre Colinge is a Director at the Taiwan Semiconductor Manufacturing Company (TSMC). He is a Fellow of the IEEE and the TSMC and received the IEEE Andrew Grove Award in 2012. He has over 35 years' experience in conducting research on semiconductor devices and has authored several books on the topic.