Power-Constrained Testing of VLSI Circuits : A Guide to the IEEE 1149.4 Test Standard

Bashir M. Al-Hashimi

ISBN 10: 140207235X / ISBN 13: 9781402072352

Published by Springer US, Springer US, 2003

About this Item

Druck auf Anfrage Neuware - Printed after ordering - Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation. For example, during the execution of built-in self-test (BIST) in-field sessions, excessive power dissipation can decrease the reliability of the circuit under test due to higher temperature and current density.Power-Constrained Testing of VLSI Circuits focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. The first part of this book surveys the existing techniques for power constrained testing of VLSI circuits. In the second part, several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths are presented.

Seller Inventory # 9781402072352

Bibliographic Details

• Title: Power-Constrained Testing of VLSI Circuits : A Guide to the IEEE 1149.4 Test Standard
• Publisher: Springer US, Springer US
• Publication Date: 2003
• Language: English
• ISBN 10: 140207235X
• ISBN 13: 9781402072352
• Binding: Buch
• Condition: Neu
• Dimensions: 241W x 160H x 16D millimeters 241 millimeters width by 160 millimeters height by 16 millimeters depth
• Weight: 459 grams

About this title

Synopsis

Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation. For example, during the execution of built-in self-test (BIST) in-field sessions, excessive power dissipation can decrease the reliability of the circuit under test due to higher temperature and current density.

Power-Constrained Testing of VLSI Circuits focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. The first part of this book surveys the existing techniques for power constrained testing of VLSI circuits. In the second part, several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths are presented.