Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)
Language: English
Published by Springer, 2003
- Hardcover
- Used
Seller: Peak Pearl LLC, Holly Springs, NC, U.S.A.Peak Pearl LLC
AbeBooks seller since December 4, 2025
Condition: Used - As new
US$ 90.00
Quantity: 1 available
Add to basketItem description from seller
Like new, never been used.
Seller Inventory # D9781402072352
- Title
- Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)
- Author
- Nicolici, Nicola; Al-Hashimi, Bashir M.
- Publisher
- Springer
- Publication year
- 2003
- Condition
- As new
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 140207235X
- ISBN 13
- 9781402072352
- Item weight
- 476 grams
- Dimensions
- 1.42 centimeters width by 16.31 centimeters height by 24.49 centimeters depth
- Series
- Book 11 of 40: Frontiers in Electronic Testing
This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.
"Synopsis" may belong to another edition of this title.
Peak Pearl LLC
Holly Springs, NC, U.S.A.
AbeBooks seller since December 4, 2025
Shipping rates within U.S.A.
| Item | 5 to 12 business days | 4 to 10 business days |
|---|---|---|
| First item | US$ 12.00 | US$ 33.00 |
Payment methods
Store description
We specialize in high-quality, pre-owned academic books that are free of internal markings.
Specialty
TextbooksSeller's business information
NC, U.S.A.