Power Integrity: Measuring, Optimizing, and Troubleshooting Power Related Parameters in Electronics Systems

Sandler, Steven M.

ISBN 10: 0071830995 / ISBN 13: 9780071830997

Published by McGraw Hill, 2014

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Bibliographic Details

• Title: Power Integrity: Measuring, Optimizing, and Troubleshooting Power Related Parameters in Electronics Systems
• Publisher: McGraw Hill
• Publication Date: 2014
• Language: English
• ISBN 10: 0071830995
• ISBN 13: 9780071830997
• Binding: Hardcover
• Condition: new

About this title

Synopsis

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PROVEN TECHNIQUES FOR GENERATING HIGH-FIDELITY MEASUREMENTS

Power Integrity: Measuring, Optimizing, and Troubleshooting Power Related Parameters in Electronics Systems provides field-tested techniques for producing high-fidelity measurements using the appropriate equipment. The book thoroughly discusses measurement guidelines, test instrument selection and use, connecting the equipment to the device being tested, and interpreting the acquired data. The latest electronics technologies and their impact on measurement are discussed. Detailed photographs, screenshots, schematics, and equations are included throughout this practical guide.

Learn how to accurately measure:

• Impedance
• Stability
• Power supply rejection ratio (PSRR)
• Reverse transfer and crosstalk
• Step load response
• Ripple and noise
• Edges
• High-frequency impedance

About the Author

Steven M. Sandler (Mesa, AZ) is currently a consultant to AEi Systems LLC, a power electronics firm he founded in 1995. He has developed and taught courses at Motorola University and has published many articles on power circuit modeling for PCIM, PEIN, and Intusoft Online. He holds a BSEE from Pacific Western University, and is the author of Spice3 SMPS Simulation.