A Probabilistic Theory of Pattern Recognition

Luc Devroye

ISBN 10: 0387946187 / ISBN 13: 9780387946184

Published by Springer New York, Springer New York Apr 1996, 1996

About this Item

Neuware -Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, free classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 660 pp. Englisch.

Seller Inventory # 9780387946184

Bibliographic Details

• Title: A Probabilistic Theory of Pattern Recognition
• Publisher: Springer New York, Springer New York Apr 1996
• Publication Date: 1996
• Language: English
• ISBN 10: 0387946187
• ISBN 13: 9780387946184
• Binding: Buch
• Condition: Neu
• Dimensions: 241W x 160H x 40D millimeters 241 millimeters width by 160 millimeters height by 40 millimeters depth
• Weight: 1144 grams

About this title

Synopsis

Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, free classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material.

From the Back Cover

Pattern recognition presents one of the most significant challenges for scientists and engineers, and many different approaches have been proposed. The aim of this book is to provide a self-contained account of probabilistic analysis of these approaches. The book includes a discussion of distance measures, nonparametric methods based on kernels or nearest neighbors, Vapnik-Chervonenkis theory, epsilon entropy, parametric classification, error estimation, tree classifiers, and neural networks. Wherever possible, distribution-free properties and inequalities are derived. A substantial portion of the results or the analysis is new. Over 430 problems and exercises complement the material.