Proceedings: Microscopy and Microanalysis 2000. Microscopy Society of America (58th Annual Meeting), Microbeam Analysis Society (34th Annual Meeting), Microscopical Society of Canada (27th Annual Meeting), Philadelphia, Pennsylvania, August 13-17, 2000 [Microscopy and Microanalysis, Volume 6, Supplement 2]

Bailey, G.W.; McKernan, S.; Price, R.L., et al., eds.

Published by Springer-Verlag New York, 2000
Condition: Used - As new Hardcover

Sold by Tiber Books, Cockeysville, MD, U.S.A.

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