Process Variations and Probabilistic Integrated Circuit Design

Joachim Haase (u. a.)

ISBN 10: 144196620X / ISBN 13: 9781441966209

Published by Springer US, 2011

About this Item

Process Variations and Probabilistic Integrated Circuit Design | Joachim Haase (u. a.) | Buch | xvi | Englisch | 2011 | Springer US | EAN 9781441966209 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.

Seller Inventory # 101190060

Bibliographic Details

• Title: Process Variations and Probabilistic Integrated Circuit Design
• Publisher: Springer US
• Publication Date: 2011
• Language: English
• ISBN 10: 144196620X
• ISBN 13: 9781441966209
• Binding: Buch
• Condition: Neu
• Dimensions: 241W x 160H x 20D millimeters 241 millimeters width by 160 millimeters height by 20 millimeters depth
• Weight: 571 grams
• Seller catalogs:
  • Bücher

About this title

Synopsis

Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

From the Back Cover

Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development.

This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.

• Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process;
• Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design;
• Describes critical effects of process variation using simple examples that can be reproduced by the reader.