Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications: 20th Iberoamerican Congress, Ciarp 2015, Montevideo, Uruguay, November 9-12, 2015, Proceedings

Pardo, Alvaro (Editor)/ Kittler, Josef (Editor)

ISBN 10: 3319257501 ISBN 13: 9783319257501
Published by Springer-Verlag New York Inc, 2015
Language: English
Condition: New Soft cover

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