Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications: 16th Iberoamerican Congress on Pattern Recognition, Ciarp 2011, Pucon, Chile, November 15-18, 2011. Proceedings

San Martin, Cesar (Editor)/ Kim, Sang-woon (Editor)

ISBN 10: 364225084X ISBN 13: 9783642250842
Published by Springer-Verlag New York Inc, 2011
Language: English
Condition: New Soft cover

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