Progress in VLSI Design and Test: 16th International Symposium on VSLI Design and Test, VDAT 2012, Shipur, India, July 1-4, 2012, Proceedings (Lecture Notes in Computer Science, 7373)
Language: English
Published by Springer, 2012
- Softcover
- New

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- Title
- Progress in VLSI Design and Test: 16th International Symposium on VSLI Design and Test, VDAT 2012, Shipur, India, July 1-4, 2012, Proceedings (Lecture Notes in Computer Science, 7373)
- Publisher
- Springer
- Publication year
- 2012
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 3642314937
- ISBN 13
- 9783642314933
This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.
"Synopsis" may belong to another edition of this title.
From the Back Cover
This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012.
The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions.
The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.
The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions.
The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.
"About the title" may belong to another edition of this title.
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