Progress in materials analysis ; Teil: Vol. 2

Grasserbauer, M. und W. Wegscheider:

ISBN 10: 3211819053 / ISBN 13: 9783211819050

Published by Wien New York : Springer-Verlag, 1985

About this Item

380 Seiten Innen sauberer, guter Zustand. Softcover, Broschur mit den üblichen Bibliotheks-Markierungen, Stempeln und Einträgen, innen wie außen, siehe Bilder. (Evtl. auch Kleber- und/oder Etikettenreste, sowie -abdrücke durch abgelöste Bibliotheksschilder). B10-01-02F|[X2488] Sprache: Englisch Gewicht in Gramm: 638.

Seller Inventory # 2064468

Bibliographic Details

• Title: Progress in materials analysis ; Teil: Vol. 2
• Publisher: Wien New York : Springer-Verlag
• Publication Date: 1985
• Language: English
• ISBN 10: 3211819053
• ISBN 13: 9783211819050
• Binding: Soft cover
• Condition: Gut
• Weight: 638 grams
• Seller catalogs:
  • Modernes Antiquariat

About this title

Synopsis

Vol. 2 of "Progress in Materials Analysis" contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti­ tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol­ ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals ............................................. .