Protocol Test Systems VIII

. Ed(s): Cavalli, Ana; Budkowski, Stan

ISBN 10: 0412781107 / ISBN 13: 9780412781100

Published by Chapman and Hall, 1996

About this Item

These papers from the 1995 International Workshop on Protocol Test Systems present research in the area of architecture and protocols for computer networks. Themes covered include testing methods, test environments, test generation, and algorithms and languages. Editor(s): Cavalli, Ana; Budkowski, Stan. Series: IFIP Advances in Information and Communication Technology. Num Pages: 464 pages, biography. BIC Classification: PHDS; UTP. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 234 x 156 x 25. Weight in Grams: 1830. . 1996. Hardback. . . . .

Seller Inventory # V9780412781100

Bibliographic Details

• Title: Protocol Test Systems VIII
• Publisher: Chapman and Hall
• Publication Date: 1996
• Language: English
• ISBN 10: 0412781107
• ISBN 13: 9780412781100
• Binding: Hardcover
• Condition: New

About this title

Synopsis

IWPTS'95 (International Workshop on Protocol Test Systems) is being held this year at !NT (Institut National des Telecommunications), Evry, France, from 4 to 6 September, 1995. IWPTS'95 is the eighth of a series of annual meetings sponsored by the IFIP Working Group WG6.1 dedicated to "Architecture and Protocols for Computer Networks". The seven previous workshops were held in Vancouver (Canada, 1988), Berlin (Germany, 1989), Mclean (USA, 1990), Leidschendam (The Netherlands, 1991), Montreal (Canada, 1992), Pau (France, 1993) and Tokyo (Japan, 1994). The workshop is a meeting place where both research and industry, theory and practice come together. By bringing both researchers and practitioners together, IWPTS opens up the communication between these groups. This helps keep the research vital and improves the state of the practitioner's art. Forty-eight papers have been submitted to IWPTS'95 and all of them have been reviewed by the members of the Program Committee and additional reviewers. The completed reviewers list is included in this Proceedings. Based on these reviews, the Program Committee selected 26 for oral presentation and 4 to be presented as posters. Two specially invited papers complete the Workshop Program, which is composed of ten sessions: Testing Methods (Session 1), Test Environments (Session 2), Theoretical Framework (Session 3), Algorithms and Languages (Session 4), Test Generation 1 (Session 5), Testability (Session 6), Test Generation 2 (Session 7), Industrial Applications (Session 8), Distributed Testing and performance (Session 9) and Test Management (Session 10).