Protocol Test Systems VIII: Proceedings of the Ifip Wg6.1 Tc6 Eighth International Workshop on Protocol Test Systems, September 1995

Cavalli, Ana (Editor)/ Budkowski, Stan (Editor)

ISBN 10: 1475763123 / ISBN 13: 9781475763126

Published by Springer Verlag, 2013

About this Item

464 pages. 9.25x6.10x1.06 inches. In Stock.

Seller Inventory # x-1475763123

Bibliographic Details

• Title: Protocol Test Systems VIII: Proceedings of the Ifip Wg6.1 Tc6 Eighth International Workshop on Protocol Test Systems, September 1995
• Publisher: Springer Verlag
• Publication Date: 2013
• Language: English
• ISBN 10: 1475763123
• ISBN 13: 9781475763126
• Binding: Paperback
• Condition: Brand New

About this title

Synopsis

IWPTS'95 (International Workshop on Protocol Test Systems) is being held this year at !NT (Institut National des Telecommunications), Evry, France, from 4 to 6 September, 1995. IWPTS'95 is the eighth of a series of annual meetings sponsored by the IFIP Working Group WG6.1 dedicated to "Architecture and Protocols for Computer Networks". The seven previous workshops were held in Vancouver (Canada, 1988), Berlin (Germany, 1989), Mclean (USA, 1990), Leidschendam (The Netherlands, 1991), Montreal (Canada, 1992), Pau (France, 1993) and Tokyo (Japan, 1994). The workshop is a meeting place where both research and industry, theory and practice come together. By bringing both researchers and practitioners together, IWPTS opens up the communication between these groups. This helps keep the research vital and improves the state of the practitioner's art. Forty-eight papers have been submitted to IWPTS'95 and all of them have been reviewed by the members of the Program Committee and additional reviewers. The completed reviewers list is included in this Proceedings. Based on these reviews, the Program Committee selected 26 for oral presentation and 4 to be presented as posters. Two specially invited papers complete the Workshop Program, which is composed of ten sessions: Testing Methods (Session 1), Test Environments (Session 2), Theoretical Framework (Session 3), Algorithms and Languages (Session 4), Test Generation 1 (Session 5), Testability (Session 6), Test Generation 2 (Session 7), Industrial Applications (Session 8), Distributed Testing and performance (Session 9) and Test Management (Session 10).