Quality and Reliability Management and Its Applications (Springer Series in Reliability Engineering)
Language: English
Published by Springer, 2016
Series: Book 49 of 90 - Springer Series in Reliability Engineering
- Softcover
- New
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pp. XVII, 451 Softcover reprint of the original 1st ed. 2016 edition NO-PA16APR2015-KAP.
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- Title
- Quality and Reliability Management and Its Applications (Springer Series in Reliability Engineering)
- Publisher
- Springer
- Publication year
- 2016
- Condition
- New
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 1447169824
- ISBN 13
- 9781447169826
- Series
- Book 49 of 90: Springer Series in Reliability Engineering
Integrating development processes, policies, and reliability predictions from the beginning of the product development lifecycle to ensure high levels of product performance and safety, this book helps companies overcome the challenges posed by increasingly complex systems in today’s competitive marketplace.
Examining both research on and practical aspects of product quality and reliability management with an emphasis on applications, the book features contributions written by active researchers and/or experienced practitioners in the field, so as to effectively bridge the gap between theory and practice and address new research challenges in reliability and quality management in practice.
Postgraduates, researchers and practitioners in the areas of reliability engineering and management, amongst others, will find the book to offer a state-of-the-art survey of quality and reliability management and practices.
"Synopsis" may belong to another edition of this title.
About the Author
Dr. Hoang Pham is Professor and Chair of the Department of Industrial and Systems Engineering at Rutgers University, New Jersey. Before joining Rutgers, he was a senior engineering specialist at the Boeing Company, Seattle and the Idaho National Engineering Laboratory, Idaho Falls. His research interests include system reliability modeling, maintenance, software reliability, probabilistic risk assessment, reliability management, and environmental risk assessment.
Dr. Pham is the author of 6 books and has edited over ten books including Handbook of Reliability Engineering (Springer-Verlag, 2003) and Springer Handbook of Engineering Statistics (Springer, 2006). He is the editor of Springer Series in Reliability Engineering and has published more than 120 journal articles, 35 book chapters, and over 50 conference papers.
Dr. Pham is the editor-in-chief of the International Journal of Reliability, Quality and Safety Engineering, and also serves as associate editor of five journals including the IEEE Trans. on Systems, Man and Cybernetics - Part A. He has been conference chair and program chair of over 35 international conferences and is currently the Conference Chair of the 18th International Conference on Reliability and Quality in Design, Boston, MA. He is a fellow of both the IEEE and IIE.
Dr. Pham received the B.S. degree in mathematics, B.S. degree in computer science, both with high honors, from Northeastern Illinois University, Chicago, the M.S. degree in statistics from the University of Illinois at Urbana-Champaign, and the M.S. and Ph.D. degrees in industrial engineering from the State University of New York at Buffalo.
Dr. Pham is the author of 6 books and has edited over ten books including Handbook of Reliability Engineering (Springer-Verlag, 2003) and Springer Handbook of Engineering Statistics (Springer, 2006). He is the editor of Springer Series in Reliability Engineering and has published more than 120 journal articles, 35 book chapters, and over 50 conference papers.
Dr. Pham is the editor-in-chief of the International Journal of Reliability, Quality and Safety Engineering, and also serves as associate editor of five journals including the IEEE Trans. on Systems, Man and Cybernetics - Part A. He has been conference chair and program chair of over 35 international conferences and is currently the Conference Chair of the 18th International Conference on Reliability and Quality in Design, Boston, MA. He is a fellow of both the IEEE and IIE.
Dr. Pham received the B.S. degree in mathematics, B.S. degree in computer science, both with high honors, from Northeastern Illinois University, Chicago, the M.S. degree in statistics from the University of Illinois at Urbana-Champaign, and the M.S. and Ph.D. degrees in industrial engineering from the State University of New York at Buffalo.
"About the title" may belong to another edition of this title.
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