Quantitative Depth Profiling And Diffusion In Thin Films (Hardcover)

This book is dedicated to the fields of quantitative depth profiling, diffusion, and surface segregation in thin solid films. It contains a curated collection of original research papers and authoritative reviews that address the latest theoretical advancements and practical applications related to the aforementioned fields. The book is structured into three parts, each offering in-depth insights into its respective field. The first part concentrates on the quantitative analysis of depth profiling data, particularly on the application of the traditional and extended Mixing-Roughness-Information (MRI) model. It explores the theoretical fundamentals and practical implementations of depth profiling techniques, providing a thorough understanding of how the MRI model enhances the analysis of thin solid films. The second part shifts focus to the diffusion phenomena in thin solid films, examining the temperature dependence and the activation energy of the interdiffusion coefficient. It elucidates the impact of diffusion processes on the performance and reliability of materials in real-world applications. The third part delves into surface segregation, discussing the equilibrium and kinetic segregation in binary alloy thin films. It highlights the Modified Darken model and explores the influence of strain on surface and interface segregation in ultrathin alloy films. Suitable for scientists, engineers, and professionals, this book serves as a fundamental reference and a guide to the latest advancements in thin film analysis. It bridges the gap between theory and practice, offering readers the tools necessary for effective quantification and analysis in the ever-evolving field of materials science.

Prof. JiangYong Wang received his PhD degree in 1997 at the University of the Free State in South Africa. From 1998 to 2000, he worked as a research associate at the Physics Department of Kansas State University in USA. In 2001, he joined the Max Plank Institute for Metals Research as a senior scientist in Germany. In 2009, he was appointed as a full professor at the Physics Department of Shantou University in China. During the past decades, he has published two book chapters and more than 180 papers (~120 SCI papers), including Nat. Comm., PRL, Adv. Mater., Acta Mater., PRB, APL. His scientific interests focus on quantification of sputter depth profiling, diffusion, segregation and phase transformation in thin solid films.

Dr XinLiang YAN obtained his Master's degree in physics from Shantou University in China in June 2012, working on surface segregation in binary alloy thin films under the supervision of Prof. JiangYong Wang. In December 2017, he completed his PhD at the University of the Free State, South Africa, conducting theoretical and experimental research on surface segregation of Cu-Ni(S) bulk and thin film alloys under the supervision of Prof. J J Terblans and Prof. H C Swart. Subsequently, he was invited to join Shantou University as a postdoctoral researcher in Prof. JiangYong Wang's group with a project titled "Surface segregation and diffusion in thin film materials". Since September 2019, Dr Yan has been working as a associate professor at the Physics Department of Guangdong Medical University in China. His current research interests include surface segregation and diffusion in thin films, depth profiling quantification, and deep learning applications in medicine. Dr Yan has made significant contributions to these fields with approximately 20 SCI papers published in renowned journals such as Applied Surface Science and Journal of Alloys and Compounds.

Dr Songyou Lian is a lecturer at the Physics Department of Shantou University. He earned his PhD from the University of the Free State in South Africa. His research focuses on diffusion in thin films, surface segregation, quantification of depth profiling, and flexible barrier films. Dr Lian has made significant contributions to these fields, with numerous first-author and corresponding-author publications in renowned journals such as Applied Surface Science. He holds two invention patents.