Quantitative x-ray diffractometry.

Zevin, Lev S.:

ISBN 10: 0387945415 / ISBN 13: 9780387945415

Published by New York, Springer, 1995

About this Item

XVII, 372 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library in GOOD condition with library-signature and stamp(s). Some traces of use. R-16139 9780387945415 Sprache: Englisch Gewicht in Gramm: 550.

Seller Inventory # 2479601

Bibliographic Details

• Title: Quantitative x-ray diffractometry.
• Publisher: New York, Springer
• Publication Date: 1995
• Language: English
• ISBN 10: 0387945415
• ISBN 13: 9780387945415
• Binding: Hardcover
• Condition: Gut
• Weight: 550 grams
• Seller catalogs:
  • SA MATHEMATIK

About this title

Synopsis

One of the most important techniques for determining the atomic structure of a material is X-ray diffraction. One of the great problems of the technique, however, is the fact that only the intensity of the diffraction pattern can be measured, not its phase. The inverse problem, of determining the structure from the pattern thus contains ambiguities that must be resolved by other means. Quantitative X-ray analysis provides one way to resolve this phase problem: mixing the material in question with a material of known structure yields interferences that can be analyzed to yield the unknown phases. Invented in 1916, but little used at the time, the technique has seen a recent revival due to the development of extremely precise X-ray diffractometers coupled with powerful computers.