Radiation Effects in Advanced Semiconductor Materials and Devices

C. Claeys

ISBN 10: 3540433937 / ISBN 13: 9783540433934

Published by Springer, Springer, 2002

About this Item

Druck auf Anfrage Neuware - Printed after ordering - In the modern semiconductor industry, there is a growing need to understand and combat potential radiation damage problems. Space applications are an obvious case, but, beyond that, today's device and circuit fabrication rely on increasing numbers of processing steps that involve an aggressive environment where inadvertant radiation damage can occur. This book is both aimed at post-graduate researchers seeking an overview of the field, and will also be immensely useful for nuclear and space engineers and even process engineers. A background knowledge of semiconductor and device physics is assumed, but the basic concepts are all briefly summarized. Finally the book outlines the shortcomings of present experimental and modeling techniques and gives an outlook on future developments.

Seller Inventory # 9783540433934

Bibliographic Details

• Title: Radiation Effects in Advanced Semiconductor Materials and Devices
• Publisher: Springer, Springer
• Publication Date: 2002
• Language: English
• ISBN 10: 3540433937
• ISBN 13: 9783540433934
• Binding: Buch
• Condition: Neu
• Dimensions: 241W x 160H x 28D millimeters 241 millimeters width by 160 millimeters height by 28 millimeters depth
• Weight: 816 grams

About this title

Synopsis

In the modern semiconductor industry, there is a growing need to understand and combat potential radiation damage problems. Space applications are an obvious case, but, beyond that, today's device and circuit fabrication rely on increasing numbers of processing steps that involve an aggressive environment where inadvertant radiation damage can occur. This book is both aimed at post-graduate researchers seeking an overview of the field, and will also be immensely useful for nuclear and space engineers and even process engineers. A background knowledge of semiconductor and device physics is assumed, but the basic concepts are all briefly summarized. Finally the book outlines the shortcomings of present experimental and modeling techniques and gives an outlook on future developments.