Title: Radiation Effects & Soft Errors .(V34) (Selected Topics in Electronics and Systems)
Publisher: World Scientific Publishing Company
Publication Date: 2004
Language: English
ISBN 10: 9812389407
ISBN 13: 9789812389404
Binding: Hardcover
Condition: New

About this title

Synopsis

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Review

"Ron Schrimpf and Dan Fleetwood are world renowned experts in radiation effects. This book is a great resource ..."

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