Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices

Ronald D Schrimpf

ISBN 10: 9812389407 / ISBN 13: 9789812389404

Published by World Scientific Publishing Co Pte Ltd, SG, 2004

About this Item

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Seller Inventory # LU-9789812389404

Bibliographic Details

• Title: Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
• Publisher: World Scientific Publishing Co Pte Ltd, SG
• Publication Date: 2004
• Language: English
• ISBN 10: 9812389407
• ISBN 13: 9789812389404
• Binding: Hardback
• Condition: New
• Dimensions: 15.24W x 2.06H x 22.86D centimeters 15.24 centimeters width by 2.06 centimeters height by 22.86 centimeters depth

About this title

Synopsis

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Review

"Ron Schrimpf and Dan Fleetwood are world renowned experts in radiation effects. This book is a great resource ..."