Random Testing of Digital Circuits: Theory and Applications
David (Author)
ISBN 10: 0824701828 ISBN 13: 9780824701826
Published by Marcel Dekker Inc, 1998
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Revaluation Books, Exeter, United Kingdom
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About this Item
Description:
1st edition. 475 pages. 10.00x6.50x1.00 inches. In Stock. Seller Inventory # __0824701828
Synopsis:
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
About the Author: Rene David is a Research Director at the Centre National de la recherche Scientififique working at the Instuit National Polytechnique de Grenoble, France.
"About this title" may belong to another edition of this title.
Bibliographic Details
Title: Random Testing of Digital Circuits: Theory ...
Publisher: Marcel Dekker Inc
Publication Date: 1998
Binding: Hardcover
Condition: Brand New
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Random Testing of Digital Circuits : Theory and Application
Published by
Marcel Dekker Inc., New York, NY, U.S.A., 1998
ISBN 10: 0824701828
ISBN 13: 9780824701826
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David, R: Random Testing of Digital Circuits
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Gebunden. Condition: New. Rene David is a Research Director at the Centre National de la recherche Scientififique working at the Instuit National Polytechnique de Grenoble, France. Introduces a theory of random testing in digital circuits for the first time and offers practi. Seller Inventory # 595073887
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